HCS L36

The Linseis HCS L36 is a modular Hall Effect measurement system for the comprehensive characterization of semiconductors and electronic materials. It determines charge carrier density, Hall constant, mobility, resistivity, and conductivity across a wide temperature range (LN₂ to 800 °C). With high-field homogeneity magnets, vacuum/inert atmosphere capability, and user-friendly software, the HCS L36 delivers precise, versatile analysis for materials such as Si, GaAs, InP, GaN, and metal oxides.

https://www.linseis.com/en/instruments/hall-effect-analyzer/hcs-l36/