TFA L59

The new Linseis TFA L59 device offers the characterization of physical properties of thin films. It is a highly integrated and easy to use measurement platform.

Physical properties of thin films differ from bulk material, as parasitic surface effects are much stronger due to smaller dimensions and high aspect ratios!

https://www.linseis.com/en/instruments/electrical-property/thin-film-thin-film-analysis/tfa-l59/